Analysis of color variation in bonded SOI wafers
P.J. Clapis, A. M. Ledger, K.E. Daniell
Abstract
P.J. Clapis, A. M. Ledger, K.E. Daniell
Abstract
In this paper, we analyze why SOI wafers appear as they do to the naked eye. We show how a thickness variation as small as ten Angstroms can cause a readily discernible color change, and why this optical effect is much stronger in a thinned SOI wafer than in an oxide-coated wafer or in thick SOI wafers.>
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In this paper, we analyze why SOI wafers appear as they do to the naked eye. We show how a thickness variation as small as ten Angstroms can cause a readily discernible color change, and why this optical effect is much stronger in a thinned SOI wafer than in an oxide-coated wafer or in thick SOI wafers.>
Key concepts: Wafer, Silicon on insulator, Angstrom, Naked eye, Variation (astronomy), Materials science, Optoelectronics, Silicon