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2004•Elsevier eBooksRequires access

The Influence of Electron Trap Capture Cross section on Carriers in Semiconductor

Rongjuan Liu, Xiuhong Dai, Guangsheng Fu, Xiaowei Li, Shaopeng Yang, Rongxiang Zhang

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Key concepts: Electron capture, Cross section (physics), Electron, Trap (plumbing), Atomic physics, Semiconductor, Charge carrier, Photoconductivity

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