2003•Unpublished venueRequires access

Piezoresistive effects in thick film resistors for strain sensing applications

D.V. Kerns, W.P. Kang, A.R. Ali-Ali

Abstract

Experimental investigations of piezoresistive effects in thick-film resistors were performed by measuring longitudinal and transverse gauge factors as a function of applied strain on two different substrates' thickness. The relative change in resistance of the thick-film resistors studied was linear, symmetric, reproducible, and free of measurable hysteresis for strain between 0 and +or-1000 microstrain. A gauge factor of approximately twice that previously reported was obtained. The suitability of this technology for strain-sensing applications is discussed.>

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Key concepts: Gauge factor, Resistor, Piezoresistive effect, Strain gauge, Strain (injury), Materials science, Hysteresis, Composite material