Scanning tunneling microscopy and spectroscopy: Theory, techniques, and applications
Dawn A. Bonnell
Abstract
Dawn A. Bonnell
Abstract
FUNDAMENTALS OF OPERATION. Introduction (D. Bonnell). Electron Tunneling, Atomic Forces, and Scanning Probe Microscopy (D. Bonnell & B. Huey). Theory of Scanning Tunneling Microscopy (J. Tersoff). Methods of Tunneling Spectroscopy with STM (R. Hamers & D. Padowitz). TIPS AND SURFACES. The Surface Structure of Crystalline Solids (W. Unertle). The Preparation of Tips and Sample Surfaces for Scanning Probe Experiments (G. Rohrer & R. Smith). APPLICATIONS OF SCANNING PROBE MICROSCOPY. Electrostatic and Magnetic Force Microscopy (S. Kalinin & D. Bonnell). BEEM and Characterization of Buried Interfaces (W. Kaiser, et al.). The Scanning Probe Microscopy in Biology (S. Lindsay). Nanomechanics with SPM (N. Burnham & R. Colton). Near Field Scanning Optical Microscopy (D. Higgins & E. Mei). Applications of Electrochemical Probe Microscopy (A. Bard & F. Fan). Appendices.
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FUNDAMENTALS OF OPERATION. Introduction (D. Bonnell). Electron Tunneling, Atomic Forces, and Scanning Probe Microscopy (D. Bonnell & B. Huey). Theory of Scanning Tunneling Microscopy (J. Tersoff). Methods of Tunneling Spectroscopy with STM (R. Hamers & D. Padowitz). TIPS AND SURFACES. The Surface Structure of Crystalline Solids (W. Unertle). The Preparation of Tips and Sample Surfaces for Scanning Probe Experiments (G. Rohrer & R. Smith). APPLICATIONS OF SCANNING PROBE MICROSCOPY. Electrostatic and Magnetic Force Microscopy (S. Kalinin & D. Bonnell). BEEM and Characterization of Buried Interfaces (W. Kaiser, et al.). The Scanning Probe Microscopy in Biology (S. Lindsay). Nanomechanics with SPM (N. Burnham & R. Colton). Near Field Scanning Optical Microscopy (D. Higgins & E. Mei). Applications of Electrochemical Probe Microscopy (A. Bard & F. Fan). Appendices.
Key concepts: Scanning tunneling microscope, Scanning probe microscopy, Scanning ion-conductance microscopy, Scanning electron microscope, Scanning tunneling spectroscopy, Microscopy, Scanning capacitance microscopy, Conductive atomic force microscopy