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2003•Unpublished venueRequires access

Characterization of VCSEL arrays using nonlinear optics and dynamics

T.B. Simpson, F. Doft, J.J. Liu, Wen‐Hao Chang, George J. Simonis

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Abstract

Arrays of vertical-cavity surface-emitting lasers (VCSELs) are now being built for use in high-speed local-area networks. The performance of individual devices depends on both intrinsic characteristics of the laser cavity and extrinsic characteristics such as circuit characteristics. Overall system performance can depend on the uniformity of devices across the array. Device parasitics can obscure the underlying intrinsic characteristics of the VCSELs.

About this research paper

What this paper is about

Arrays of vertical-cavity surface-emitting lasers (VCSELs) are now being built for use in high-speed local-area networks. The performance of individual devices depends on both intrinsic characteristics of the laser cavity and extrinsic characteristics such as circuit characteristics. Overall system performance can depend on the uniformity of devices across the array. Device parasitics can obscure the underlying intrinsic characteristics of the VCSELs.

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Available abstract

Arrays of vertical-cavity surface-emitting lasers (VCSELs) are now being built for use in high-speed local-area networks. The performance of individual devices depends on both intrinsic characteristics of the laser cavity and extrinsic characteristics such as circuit characteristics. Overall system performance can depend on the uniformity of devices across the array. Device parasitics can obscure the underlying intrinsic characteristics of the VCSELs.

Key concepts: Parasitic extraction, Vertical-cavity surface-emitting laser, Optoelectronics, Laser, Characterization (materials science), Materials science, Semiconductor laser theory, Optics

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