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THE INTENSITY OF $beta$ ACTIVITY FROM THICK SOURCES. PART II

B.J. Bowles, Gilbert N. Walton

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Abstract

Further measurements of the effect of source thickness on the counting rate recorded by beta counters for spread sources are reported. As predicted by theory, the ratio between a very thick source and very thin source for an end window counter is double that for the same sources in a 2 pi counter. Changes in wall scattering are more important than changes in source position, on the source thickness effect for an end window counter. (auth)

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What this paper is about

Further measurements of the effect of source thickness on the counting rate recorded by beta counters for spread sources are reported. As predicted by theory, the ratio between a very thick source and very thin source for an end window counter is double that for the same sources in a 2 pi counter. Changes in wall scattering are more important than changes in source position, on the source thickness effect for an end window counter. (auth)

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Available abstract

Further measurements of the effect of source thickness on the counting rate recorded by beta counters for spread sources are reported. As predicted by theory, the ratio between a very thick source and very thin source for an end window counter is double that for the same sources in a 2 pi counter. Changes in wall scattering are more important than changes in source position, on the source thickness effect for an end window counter. (auth)

Key concepts: BETA (programming language), Proportional counter, Beta particle, Physics, Window (computing), Optics, Intensity (physics), Position (finance)

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