2007•Advances in Solid State PhysicsRequires access
Scanning probe microscopy with “chemical sensitivity”
Georg Krausch
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Abstract
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Georg Krausch
Abstract
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Key concepts: Near-field scanning optical microscope, Scanning ion-conductance microscopy, Scanning probe microscopy, Microscopy, Scanning tunneling microscope, Resolution (logic), Scanning confocal electron microscopy, Vibrational analysis with scanning probe microscopy