90nm low leakage SoC design techniques for wireless applications
Philippe Royannez, H. Mair, Franck Dahan, M. Wagner, M. Streeter, L. Bouetel, J. Blasquez, H. Clasen, G. Semino, Julie Dong, D.B. Scott, B. Pitts, C. Raibaut, Uming Ko
Abstract
Philippe Royannez, H. Mair, Franck Dahan, M. Wagner, M. Streeter, L. Bouetel, J. Blasquez, H. Clasen, G. Semino, Julie Dong, D.B. Scott, B. Pitts, C. Raibaut, Uming Ko
Abstract
The new generation of multimedia-application processors requires a drastic leakage reduction to bring the standby current to 50/spl mu/A. An efficient set of leakage reduction techniques, including power gating, memory retention, voltage scaling, and dual V/sub t/, is employed on a 50M transistor, 80mm/sup 2/ IC, fabricated in a 90nm CMOS technology, resulting in a 40/spl times/ leakage reduction.
OpenAlex reports 99 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
The new generation of multimedia-application processors requires a drastic leakage reduction to bring the standby current to 50/spl mu/A. An efficient set of leakage reduction techniques, including power gating, memory retention, voltage scaling, and dual V/sub t/, is employed on a 50M transistor, 80mm/sup 2/ IC, fabricated in a 90nm CMOS technology, resulting in a 40/spl times/ leakage reduction.
Key concepts: Leakage power, CMOS, Leakage (economics), Standby power, Low-power electronics, Power gating, Electrical engineering, Computer science