μiTRON customization for use in automated test equipment

Automated test equipment (ATE) plays an important role in manufacturing and testing of devices and systems. The complexity of the test equipment increases as new devices with increasing complexity are introduced. For the manufacturer of ATE, it is important that the new requirements of testing are met by simplifying the implementation of ATE itself. In this context, it is necessary that the ATE has a scalable operating system that can be stretched to fulfill complex testing needs incrementally. /spl mu/iTRON has all the necessary features that can address these needs. /spl mu/iTRON provides a broad frame work from which a customized version to address a specific market segment can be easily developed. /spl mu/iTRON provides rich set of features that can be used for testing of complex devices or systems. This paper discusses the important requirements of an ATE and how /spl mu/iTRON can be developed and customized to meet the requirements. Two different scenarios are discussed: a) customization of /spl mu/iTRON for use in a test equipment; and b) automatic configuration of /spl mu/iTRON for use on target unit to be tested.