2016Unpublished venueOpen access

Advances in unit testing

Tao Xie, Nikolai Tillmann, Pratap Lakshman

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Abstract

Parameterized unit testing, recent advances in unit testing, is a new methodology extending the previous industry practice based on traditional unit tests without parameters. A parameterized unit test (PUT) is simply a test method that takes parameters, calls the code under test, and states assertions. Parameterized unit testing allows the separation of two testing concerns or tasks: the specification of external, black-box behavior (i.e., assertions or specifications) by developers and the generation and selection of internal, white-box test inputs (i.e., high-code-covering test inputs) by tools. PUTs have been supported by various testing frameworks. Various open source and industrial testing tools also exist to generate test inputs for PUTs. This technical briefing presents latest research on principles and techniques, as well as practical considerations to apply parameterized unit testing on real-world programs, highlighting success stories, research and education achievements, and future research directions in developer testing.

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Parameterized unit testing, recent advances in unit testing, is a new methodology extending the previous industry practice based on traditional unit tests without parameters. A parameterized unit test (PUT) is simply a test method that takes parameters, calls the code under test, and states assertions. Parameterized unit testing allows the separation of two testing concerns or tasks: the specification of external, black-box behavior (i.e., assertions or specifications) by developers and the generation and selection of internal, white-box test inputs (i.e., high-code-covering test inputs) by tools. PUTs have been supported by various testing frameworks. Various open source and industrial testing tools also exist to generate test inputs for PUTs. This technical briefing presents latest research on principles and techniques, as well as practical considerations to apply parameterized unit testing on real-world programs, highlighting success stories, research and education achievements, and future research directions in developer testing.

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Available abstract

Parameterized unit testing, recent advances in unit testing, is a new methodology extending the previous industry practice based on traditional unit tests without parameters. A parameterized unit test (PUT) is simply a test method that takes parameters, calls the code under test, and states assertions. Parameterized unit testing allows the separation of two testing concerns or tasks: the specification of external, black-box behavior (i.e., assertions or specifications) by developers and the generation and selection of internal, white-box test inputs (i.e., high-code-covering test inputs) by tools. PUTs have been supported by various testing frameworks. Various open source and industrial testing tools also exist to generate test inputs for PUTs. This technical briefing presents latest research on principles and techniques, as well as practical considerations to apply parameterized unit testing on real-world programs, highlighting success stories, research and education achievements, and future research directions in developer testing.

Key concepts: Unit testing, Parameterized complexity, White-box testing, Computer science, Integration testing, Test strategy, Black box, Black-box testing

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