Meir Y. Grajower, Yoel Sebbag, Alex Naiman, Boris Desiatov, Uriel Levy
Abstract
We observe for the first time the near field optical intensity distribution of silicon nanophotonic devices operating in the mid-IR spectrum using our scanning thermal microscopy and demonstrate its advantages over conventional NSOM technique.
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We observe for the first time the near field optical intensity distribution of silicon nanophotonic devices operating in the mid-IR spectrum using our scanning thermal microscopy and demonstrate its advantages over conventional NSOM technique.
Key concepts: Near-field scanning optical microscope, Nanophotonics, Silicon, Optical microscope, Materials science, Infrared microscopy, Microscopy, Optics