Meir Grajower, Liron Stern, Boris Desiatov, Ilya Goykhman, Uriel Levy
Abstract
We observe directly for the first time optical near field in silicon nanophotonics devices with nanoscale resolution using near field scanning thermal microscopy and demonstrated its advantage over the NSOM technique.
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We observe directly for the first time optical near field in silicon nanophotonics devices with nanoscale resolution using near field scanning thermal microscopy and demonstrated its advantage over the NSOM technique.
Key concepts: Nanophotonics, Near-field scanning optical microscope, Scanning thermal microscopy, Silicon, Materials science, Optical microscope, Microscopy, Near and far field