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Magnetic Field Effect in Scanning Tunneling Microscopy

吴章华, 王福熹

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Abstract

1 Introduction Scanning tunneling microscopy (STM) attracts increasing interest in surface information research with atomic resolution. Since the pioneer work of G. Binnig and H. Rohrer, it has been developed rapidly in this field. Many new instruments have been invented such as atomic force microscopy (AFM), scanning tunneling potentiometry (STP), scanning near field optical microscopy (SNOM) and ballistic electron emission microscopy (BEEM).

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What this paper is about

1 Introduction Scanning tunneling microscopy (STM) attracts increasing interest in surface information research with atomic resolution. Since the pioneer work of G. Binnig and H. Rohrer, it has been developed rapidly in this field. Many new instruments have been invented such as atomic force microscopy (AFM), scanning tunneling potentiometry (STP), scanning near field optical microscopy (SNOM) and ballistic electron emission microscopy (BEEM).

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Available abstract

1 Introduction Scanning tunneling microscopy (STM) attracts increasing interest in surface information research with atomic resolution. Since the pioneer work of G. Binnig and H. Rohrer, it has been developed rapidly in this field. Many new instruments have been invented such as atomic force microscopy (AFM), scanning tunneling potentiometry (STP), scanning near field optical microscopy (SNOM) and ballistic electron emission microscopy (BEEM).

Key concepts: Scanning tunneling microscope, Scanning ion-conductance microscopy, Near-field scanning optical microscope, Conductive atomic force microscopy, Spin polarized scanning tunneling microscopy, Scanning confocal electron microscopy, Scanning probe microscopy, Microscopy

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