Reliability analysis of the scram system of the Missouri University research reactor
Robert A. Werner, S.K. Loyalka
Abstract
Robert A. Werner, S.K. Loyalka
Abstract
The reliability analysis of anticipated transients without scram is a topic of considerable significance in reactor safety studies. The article describes the results of a recently completed study on the reliability of the Missouri University Research Reactor (MURR) scram system. For this reactor it has been determined that the failure to initiate a scram automatically or manually within 7.5 sec of an isolation-valve closure can lead to core meltdown. Since valve closure is a credible accident (it has occurred once during the past 5 years), it is important to know the reliability of the scram system. The authors have used the event and fault-tree methodologies to analyze accident sequences and the scram system. Several common-mode failures have been identified, and the availability probabilities for each primary event were obtained by a detailed examination of the MURR operating records. Detailed analysis shows that the MURR scram system is highly reliable.
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The reliability analysis of anticipated transients without scram is a topic of considerable significance in reactor safety studies. The article describes the results of a recently completed study on the reliability of the Missouri University Research Reactor (MURR) scram system. For this reactor it has been determined that the failure to initiate a scram automatically or manually within 7.5 sec of an isolation-valve closure can lead to core meltdown. Since valve closure is a credible accident (it has occurred once during the past 5 years), it is important to know the reliability of the scram system. The authors have used the event and fault-tree methodologies to analyze accident sequences and the scram system. Several common-mode failures have been identified, and the availability probabilities for each primary event were obtained by a detailed examination of the MURR operating records. Detailed analysis shows that the MURR scram system is highly reliable.
Key concepts: Scram, Reliability (semiconductor), Reliability engineering, Fault tree analysis, Engineering, Event (particle physics), Closure (psychology), Failure mode and effects analysis