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Study on wheat yield loss caused by infestation of Alopecurus japonicus and Vicia sativa.

Guan LiQuin, Hou QuanMin, Chen Jian-sheng, Zhang SongHan, Wang ZhiXiong

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Key concepts: Vicia sativa, Agronomy, Yield (engineering), Infestation, Vicia, Biology, Materials science, Vicia faba

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Study on wheat yield loss caused by infestation of Alopecurus japonicus and Vicia sativa. — Research Paper | ScholarLens