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CHARACTERIZATION OF SILICON SULFIDES BY CHIRPED-PULSE ROTATIONAL SPECTROSCOPY

Michael C. McCarthy, Kyle N. Crabtree, Oscar Martinez

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Abstract

Author Institution: Harvard-Smithsonian Center for Astrophysics, 60 Garden Street, Cambridge, MA 02138, and; School of Engineering and Applied Sciences, Harvard University, 29 Oxford Street, Cambridge, MA 02138

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What this paper is about

Author Institution: Harvard-Smithsonian Center for Astrophysics, 60 Garden Street, Cambridge, MA 02138, and; School of Engineering and Applied Sciences, Harvard University, 29 Oxford Street, Cambridge, MA 02138

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Available abstract

Author Institution: Harvard-Smithsonian Center for Astrophysics, 60 Garden Street, Cambridge, MA 02138, and; School of Engineering and Applied Sciences, Harvard University, 29 Oxford Street, Cambridge, MA 02138

Key concepts: Characterization (materials science), Spectroscopy, Silicon, Materials science, Ultrashort pulse, Optics, Optoelectronics, Nanotechnology

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