Electronic component reliability analysis by data reduction system
R. M. Dimm, D. G. Hunt
Abstract
R. M. Dimm, D. G. Hunt
Abstract
Mechanized data reduction system has been designed to take advantage of the data handling capacity of computers and to reduce voluminous and unrelated test and performance data to a format useful for the rapid analysis of electronic component reliability.
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Mechanized data reduction system has been designed to take advantage of the data handling capacity of computers and to reduce voluminous and unrelated test and performance data to a format useful for the rapid analysis of electronic component reliability.
Key concepts: Reliability (semiconductor), Component (thermodynamics), Reliability engineering, Computer science, Data reduction, Reduction (mathematics), Data mining, Engineering