Rejecting diffractometer with linear coordinate detector for single crystals
O.I. Ageev, L.P. Glazova, D.A. Goganov, B.V. Kazanskii, B.M. Reizis
Abstract
O.I. Ageev, L.P. Glazova, D.A. Goganov, B.V. Kazanskii, B.M. Reizis
Abstract
Use of an x-ray beam that is convergent in the specimen and a recording system based on a linear coordinate detector has led to the creation of the ADR-3--a new type of goniometer-free rejecting diffractometer. The deviation of this orientation angle of the surface of a cut from a specified angle is determined by electronic data processing entirely without mechanical movement. The rejector can check the quality of cut treatment and allows the block distribution over the surface of a single crystal to be studied with a localization of 0.2 mm. The test results of the goniometer-free rejecting diffractometer showed its ability to check cut angles under industrial conditions.
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Use of an x-ray beam that is convergent in the specimen and a recording system based on a linear coordinate detector has led to the creation of the ADR-3--a new type of goniometer-free rejecting diffractometer. The deviation of this orientation angle of the surface of a cut from a specified angle is determined by electronic data processing entirely without mechanical movement. The rejector can check the quality of cut treatment and allows the block distribution over the surface of a single crystal to be studied with a localization of 0.2 mm. The test results of the goniometer-free rejecting diffractometer showed its ability to check cut angles under industrial conditions.
Key concepts: Goniometer, Diffractometer, Optics, Orientation (vector space), Detector, Surface (topology), Materials science, Block (permutation group theory)