Electron backscatter diffraction (EBSD) map of AZ31 compressed to 1% strain at room temperature in a direction parallel to the extrusion direction
Mark D. Nave
Abstract
Mark D. Nave
Abstract
The collection contains an EBSD map of AZ31 compressed to 1% strain at room temperature in a direction parallel to the extrusion direction. The map was collected as part of an investigation into the role of twinning in the occurrence of a yield point elongation during deformation.
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The collection contains an EBSD map of AZ31 compressed to 1% strain at room temperature in a direction parallel to the extrusion direction. The map was collected as part of an investigation into the role of twinning in the occurrence of a yield point elongation during deformation.
Key concepts: Electron backscatter diffraction, Extrusion, Crystal twinning, Materials science, Deformation (meteorology), Backscatter (email), Strain (injury), Diffraction