Michael K. Miller
Abstract
Preface. Acknowledgements. 1. Overview and Historical Evolution. 2. The Art of Specimen Preparation. 3. Field Ion Microscopy. 4. Instrumentation. 5. Experimental Factors. 6. Data Representations and Analysis. Bibliography. Appendices.
OpenAlex reports 609 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
Preface. Acknowledgements. 1. Overview and Historical Evolution. 2. The Art of Specimen Preparation. 3. Field Ion Microscopy. 4. Instrumentation. 5. Experimental Factors. 6. Data Representations and Analysis. Bibliography. Appendices.
Key concepts: Atom probe, Tomography, Atom (system on chip), Materials science, Physics, Optics, Computer science, Transmission electron microscopy