2011•Unpublished venueRequires access

Semiconductor Power Devices: Physics, Characteristics, Reliability

Josef Lutz, Heinrich Schlangenotto, Uwe Scheuermann, Rik De Doncker

Open publisher page 284 citations

Abstract

This record does not include an abstract. Use the full-text link above if available.

About this research paper

What this paper is about

An abstract is not available in the OpenAlex record for this paper.

Why it matters

OpenAlex reports 284 citations for this work. Citation counts describe recorded attention and do not establish research quality.

Key contribution

A contribution statement is not available in the OpenAlex record.

Method / approach

Method details are not available in the OpenAlex metadata.

Main findings

Findings are not separately available in the OpenAlex metadata.

Limitations

Limitations are not available in the OpenAlex metadata.

Applications

Application details are not available in the OpenAlex metadata.

Key concepts: Power semiconductor device, Schottky diode, Diode, Semiconductor device, Bipolar junction transistor, Reliability (semiconductor), Electrical engineering, Thyristor

Back to paper search Browse research topics Original source

Semiconductor Power Devices: Physics, Characteristics, Reliability — Research Paper | ScholarLens