Voigt function model in diffraction-line broadening analysis

Abstract Abstract Diffraction-line broadening routes are briefly reviewed. Both laboratory and synchrotron X-ray measurements of Wand MgO showed that a Voigt function satisfactorily fits the physically broadened line profiles. The consequences of an assumed Voigt function profile shape for both size-broadened and strain-broadened profiles (‘double-Voigt’ method) are studied. It is shown that the relationship between parameters obtained by the Warren-Averbach approximation and integral-breadth methods becomes possible. Line-broadening analysis of W and MgO is performed by using the Warren–Averbach and ‘double-Voigt’ approaches and results are compared.