A 0.011%/V LS and −76-dB PSRR Self-Biased CMOS Voltage Reference With Quasi Self-Cascode Current Mirror
Kai An Yu, Jiyang Chen, Sizhen Li, Mo Huang
Abstract
Kai An Yu, Jiyang Chen, Sizhen Li, Mo Huang
Abstract
This brief proposes a nano-watt self-biased CMOS voltage reference (SBCVR) with a quasi self-cascode current mirror (QSCCM) for better line sensitivity (LS) and power supply rejection ratio (PSRR). A self-cascode MOSFET (SCM) and a cascode structure are combined as the QSCCM to reduce the variations of bias current$(I_{\mathrm{ B}})$through the QSCCM, comparing to conventional ones. Then, the$I_{\mathrm{ B}}$is fed into an active load to acquire a more stable reference voltage$(V_{\mathrm{ REF}})$against the supply voltage$(V_{\mathrm{ DD}})$without using any additional native devices, amplifiers, pre-regulation circuits, and DIBL compensation circuits. The proposed SBCVR with the QSCCM is fabricated in a standard$0.18 \mu \text{m}$CMOS process, while 22 chip samples are measured. The results show that the average LS is 0.011%/V when the$V_{\mathrm{ DD}}$varies from 0.8 V to 1.8 V. The average PSRR are −76dB, −53 dB, and −59 dB at 10Hz, 1kHz, and 1MHz respectively. Moreover, it can produce a$V_{\mathrm{ REF}}$of 293 mV and consume a supply current of 1.95 nA$(V_{\mathrm{ DD}}=$1V) at 27 °C. The average temperature coefficient (TC) is 66.1 ppm/°C without trimming in the temperature range from −40 °C to 85 °C, while the total area is only 0.004 mm 2.
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This brief proposes a nano-watt self-biased CMOS voltage reference (SBCVR) with a quasi self-cascode current mirror (QSCCM) for better line sensitivity (LS) and power supply rejection ratio (PSRR). A self-cascode MOSFET (SCM) and a cascode structure are combined as the QSCCM to reduce the variations of bias current$(I_{\mathrm{ B}})$through the QSCCM, comparing to conventional ones. Then, the$I_{\mathrm{ B}}$is fed into an active load to acquire a more stable reference voltage$(V_{\mathrm{ REF}})$against the supply voltage$(V_{\mathrm{ DD}})$without using any additional native devices, amplifiers, pre-regulation circuits, and DIBL compensation circuits. The proposed SBCVR with the QSCCM is fabricated in a standard$0.18 \mu \text{m}$CMOS process, while 22 chip samples are measured. The results show that the average LS is 0.011%/V when the$V_{\mathrm{ DD}}$varies from 0.8 V to 1.8 V. The average PSRR are −76dB, −53 dB, and −59 dB at 10Hz, 1kHz, and 1MHz respectively. Moreover, it can produce a$V_{\mathrm{ REF}}$of 293 mV and consume a supply current of 1.95 nA$(V_{\mathrm{ DD}}=$1V) at 27 °C. The average temperature coefficient (TC) is 66.1 ppm/°C without trimming in the temperature range from −40 °C to 85 °C, while the total area is only 0.004 mm 2.
Key concepts: Notation, CMOS, Power supply rejection ratio, Topology (electrical circuits), Electrical engineering, Biasing, Amplifier, Physics