Micro-angle attitude measurement technology and research progress based on quantum weak value measurement
Yongchao Zhang, Xiaoxu Liu, Tieli Zhang, YongYao Xu, Yulu Wang, Zongjun Wang
Abstract
Yongchao Zhang, Xiaoxu Liu, Tieli Zhang, YongYao Xu, Yulu Wang, Zongjun Wang
Abstract
Due to the limitation of standard quantum limit (SQL), traditional laser interferometry based micro angle attitude measurement technology cannot further improve its measurement accuracy. Applying quantum weak value measurement technology to micro angle measurement will greatly improve its measurement accuracy. This article introduces the basic principle of quantum weak value measurement, and introduces the research progress in micro bit angle/displacement measurement using quantum weak value measurement technology in recent years. The future application trend of quantum weak measurement technology in micro angle is analyzed and prospected.
OpenAlex reports 1 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
Due to the limitation of standard quantum limit (SQL), traditional laser interferometry based micro angle attitude measurement technology cannot further improve its measurement accuracy. Applying quantum weak value measurement technology to micro angle measurement will greatly improve its measurement accuracy. This article introduces the basic principle of quantum weak value measurement, and introduces the research progress in micro bit angle/displacement measurement using quantum weak value measurement technology in recent years. The future application trend of quantum weak measurement technology in micro angle is analyzed and prospected.
Key concepts: Weak measurement, Measurement device, Quantum limit, Quantum measurement, Measurement uncertainty, Quantum metrology, Quantum sensor, Quantum