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2023•Journal of Student ResearchOpen access

Analyzing Properties of Monolayer MoS2 Using RHEED and Ultrafast Electron Diffraction

Calvin Chiu, Thomas S. Liang

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Abstract

Reflection high-energy electron diffraction (RHEED) and ultrafast electron diffraction (UED) are techniques used to characterize crystal structures both statically and dynamically. These experimental methods are of academic interest due to their ability to visualize crystal structures on the atomic level and analyze dynamic changes on the picosecond scale. In this experiment, RHEED and UED are implemented to analyze monolayer molybdenum disulfide (MoS2), a compound that may contribute to the future of microelectronics. Images of various diffraction patterns are presented, and analysis is conducted on diffraction peaks, lattice spacing, and photoinduced intensity changes.

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What this paper is about

Reflection high-energy electron diffraction (RHEED) and ultrafast electron diffraction (UED) are techniques used to characterize crystal structures both statically and dynamically. These experimental methods are of academic interest due to their ability to visualize crystal structures on the atomic level and analyze dynamic changes on the picosecond scale. In this experiment, RHEED and UED are implemented to analyze monolayer molybdenum disulfide (MoS2), a compound that may contribute to the future of microelectronics. Images of various diffraction patterns are presented, and analysis is conducted on diffraction peaks, lattice spacing, and photoinduced intensity changes.

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Available abstract

Reflection high-energy electron diffraction (RHEED) and ultrafast electron diffraction (UED) are techniques used to characterize crystal structures both statically and dynamically. These experimental methods are of academic interest due to their ability to visualize crystal structures on the atomic level and analyze dynamic changes on the picosecond scale. In this experiment, RHEED and UED are implemented to analyze monolayer molybdenum disulfide (MoS2), a compound that may contribute to the future of microelectronics. Images of various diffraction patterns are presented, and analysis is conducted on diffraction peaks, lattice spacing, and photoinduced intensity changes.

Key concepts: Reflection high-energy electron diffraction, Electron diffraction, Monolayer, Gas electron diffraction, Materials science, Molybdenum disulfide, Diffraction, Picosecond

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