Probabilistic damage tolerance assessment method based on the multi-scale crack growth model
Rong-Sheng Lu, Jie Yang, Ji Wang, Run‐Zi Wang, Valery N. Shlyannikov, Xian‐Cheng Zhang, Shan‐Tung Tu
Abstract
Rong-Sheng Lu, Jie Yang, Ji Wang, Run‐Zi Wang, Valery N. Shlyannikov, Xian‐Cheng Zhang, Shan‐Tung Tu
Abstract
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Key concepts: Damage tolerance, Paris' law, Structural engineering, Probabilistic logic, Fracture mechanics, Reliability (semiconductor), Stress intensity factor, Fracture toughness