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A 20 kHz, 1.2 J, 20 ns pulse-burst laser for electron temperature and density measurement in a magnetically confined high-temperature plasma

Ryo Yasuhara, H. Funaba, Hiroki Uehara, D Den Hartog

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Abstract

In order to deepen understanding of transient phenomena in magnetically confined plasmas, a high-time resolution (up to 20 kHz) Thomson scattering diagnostic system for measurement of electron temperature and density profiles has been developed. A key system component is a Nd: YAG laser which produces a burst of 1.2 J, 20 ns pulses. This diagnostic system is used to investigate transient plasma phenomena such as electron cyclotron heating, the injection of hydrogen pellets, and plasma collapse.

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What this paper is about

In order to deepen understanding of transient phenomena in magnetically confined plasmas, a high-time resolution (up to 20 kHz) Thomson scattering diagnostic system for measurement of electron temperature and density profiles has been developed. A key system component is a Nd: YAG laser which produces a burst of 1.2 J, 20 ns pulses. This diagnostic system is used to investigate transient plasma phenomena such as electron cyclotron heating, the injection of hydrogen pellets, and plasma collapse.

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Available abstract

In order to deepen understanding of transient phenomena in magnetically confined plasmas, a high-time resolution (up to 20 kHz) Thomson scattering diagnostic system for measurement of electron temperature and density profiles has been developed. A key system component is a Nd: YAG laser which produces a burst of 1.2 J, 20 ns pulses. This diagnostic system is used to investigate transient plasma phenomena such as electron cyclotron heating, the injection of hydrogen pellets, and plasma collapse.

Key concepts: Thomson scattering, Electron temperature, Plasma, Laser, Electron, Atomic physics, Plasma diagnostics, Electron density

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A 20 kHz, 1.2 J, 20 ns pulse-burst laser for electron temperature and density measurement in a magnetically confined high-temperature plasma — Research Paper | ScholarLens