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2022•Unpublished venueRequires access

Measurements of Extremely Small Inductance Values: Offset elimination technique for small inductance measurements using two-wire connection

M.S. Obrecht

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Abstract

Measurement of small inductors is the trickiest compared to other component testing using typical LCR-meters providing test frequency of 100 kHz or lower. Inductance of 1 nH at 100 kHz only produces 6 mOhm impedance that is comparable to a contact resistance of the probes. Even at 1 MHz the impedance would only be 60 mOhms. We demonstrate a simple method of extraction of the two-wire probe parasitic inductance using HP4284A LCR-meter and HP16034E test fixture. The method effectively allows to measure sub nH inductors.

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What this paper is about

Measurement of small inductors is the trickiest compared to other component testing using typical LCR-meters providing test frequency of 100 kHz or lower. Inductance of 1 nH at 100 kHz only produces 6 mOhm impedance that is comparable to a contact resistance of the probes. Even at 1 MHz the impedance would only be 60 mOhms. We demonstrate a simple method of extraction of the two-wire probe parasitic inductance using HP4284A LCR-meter and HP16034E test fixture. The method effectively allows to measure sub nH inductors.

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Available abstract

Measurement of small inductors is the trickiest compared to other component testing using typical LCR-meters providing test frequency of 100 kHz or lower. Inductance of 1 nH at 100 kHz only produces 6 mOhm impedance that is comparable to a contact resistance of the probes. Even at 1 MHz the impedance would only be 60 mOhms. We demonstrate a simple method of extraction of the two-wire probe parasitic inductance using HP4284A LCR-meter and HP16034E test fixture. The method effectively allows to measure sub nH inductors.

Key concepts: LCR meter, Inductance, Inductor, Materials science, Electrical impedance, Test fixture, Parasitic element, Offset (computer science)

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