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Outstation for x-ray powder diffraction at the Italian beamline at the European synchrotron

Giovanni Orazio Lepore, Stefano Checchia, Tommaso Baroni, Michela Brunelli, F. D’Acapito

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Abstract

LISA [Linea Italiana per la Spettroscopia di Assorbimento X, Italian beamline for X-ray Absorption Spectroscopy (XAS)] is the Italian CRG (Collaborating Research Group) beamline at the ESRF (European Synchrotron Radiation Facility) dedicated to XAS [d'Acapito et al., J. Synchrotron Radiat. 26, 551-558 (2019)]. In this work, a methodical test of the LISA beamline in performing diffraction measurements is carried out. Synchrotron x-ray diffraction measurements would complement absorption spectroscopy techniques with the long-range characterization of the material under investigation, while XAS provides the short-range element selective information.

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What this paper is about

LISA [Linea Italiana per la Spettroscopia di Assorbimento X, Italian beamline for X-ray Absorption Spectroscopy (XAS)] is the Italian CRG (Collaborating Research Group) beamline at the ESRF (European Synchrotron Radiation Facility) dedicated to XAS [d'Acapito et al., J. Synchrotron Radiat. 26, 551-558 (2019)]. In this work, a methodical test of the LISA beamline in performing diffraction measurements is carried out. Synchrotron x-ray diffraction measurements would complement absorption spectroscopy techniques with the long-range characterization of the material under investigation, while XAS provides the short-range element selective information.

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Available abstract

LISA [Linea Italiana per la Spettroscopia di Assorbimento X, Italian beamline for X-ray Absorption Spectroscopy (XAS)] is the Italian CRG (Collaborating Research Group) beamline at the ESRF (European Synchrotron Radiation Facility) dedicated to XAS [d'Acapito et al., J. Synchrotron Radiat. 26, 551-558 (2019)]. In this work, a methodical test of the LISA beamline in performing diffraction measurements is carried out. Synchrotron x-ray diffraction measurements would complement absorption spectroscopy techniques with the long-range characterization of the material under investigation, while XAS provides the short-range element selective information.

Key concepts: Beamline, Synchrotron radiation, Synchrotron, X-ray absorption spectroscopy, Materials science, Optics, Powder diffraction, Diffraction

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