1997•Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIERequires access

Measurement of waveplate retardation using a photoelastic modulator

Theodore C. Oakberg

Abstract

A system for measurement of waveplate retardation using a photoelastic modulator will be described. The system is intended for incoming quality inspection of quarter-wave plates at 632.8 nm and 900 nm. Measurement of several polymer waveplates were in good agreement with the waveplate manufacturer's calibration data.

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Key concepts: Waveplate, Optics, Calibration, Optical modulator, Materials science, Computer science, Physics, Phase modulation