1989Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIERequires access

Theoretical And Experimental Evaluation Of Isoplanatic Patch Size For Adaptive Optics

F. Chassat, G. Rousset, Jérôme Primot

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Abstract

Correlation functions of the Zernike-polynomial expansion coefficients of turbulence induced aberrated wavefronts are presented and experimentally confirmed using laboratory-generated Kolrnogorov turbulence. These functions are convenient for characterizing the anisoplanatic error for adaptive optics. The isoplanatic patch-size of such systems is evaluable according to their specific working parameters. We find, for example, with a 4 m telescope working at 3.5 μm and sensing the wavefront phase fluctuation on 20 Zernike polynomials, an isoplanatic patch about 22 arcseconds wide.

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Correlation functions of the Zernike-polynomial expansion coefficients of turbulence induced aberrated wavefronts are presented and experimentally confirmed using laboratory-generated Kolrnogorov turbulence. These functions are convenient for characterizing the anisoplanatic error for adaptive optics. The isoplanatic patch-size of such systems is evaluable according to their specific working parameters. We find, for example, with a 4 m telescope working at 3.5 μm and sensing the wavefront phase fluctuation on 20 Zernike polynomials, an isoplanatic patch about 22 arcseconds wide.

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Available abstract

Correlation functions of the Zernike-polynomial expansion coefficients of turbulence induced aberrated wavefronts are presented and experimentally confirmed using laboratory-generated Kolrnogorov turbulence. These functions are convenient for characterizing the anisoplanatic error for adaptive optics. The isoplanatic patch-size of such systems is evaluable according to their specific working parameters. We find, for example, with a 4 m telescope working at 3.5 μm and sensing the wavefront phase fluctuation on 20 Zernike polynomials, an isoplanatic patch about 22 arcseconds wide.

Key concepts: Adaptive optics, Optics, Materials science, Computer science, Remote sensing, Physics, Geology

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