2021β€’Unpublished venueOpen access

Classical and Bayesian Uncertainty Intervals for the Reliability of Multidimensional Scales

Julius M. Pfadt, Don van den Bergh, Morten Moshagen

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Abstract

The reliability of a multidimensional test instrument is commonly estimated using coefficients πœ”π‘‘ (total) and πœ”h (hierarchical). However, point estimates for the coefficients are rarely accompanied by uncertainty estimates. In this study, we compare bootstrap and normal-theory confidence intervals. In addition, we develop Bayesian versions of coefficients πœ”π‘‘ and πœ”h by sampling from a second-order factor model. Results from a comprehensive simulation study show that the studied confidence intervals performed well when the sample size was sufficiently large (𝑁 β‰₯ 500). The Bayesian estimates performed well across most studied conditions. When the sample size was small and the reliability low, only the bias-corrected and accelerated bootstrap confidence interval approached a satisfactory coverage among all intervals. This study guides on πœ”π‘‘ and πœ”h confidence intervals and introduces πœ”π‘‘ and πœ”h credible intervals that are easy to use and come with the benefits of Bayesian parameter estimation.

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The reliability of a multidimensional test instrument is commonly estimated using coefficients πœ”π‘‘ (total) and πœ”h (hierarchical). However, point estimates for the coefficients are rarely accompanied by uncertainty estimates. In this study, we compare bootstrap and normal-theory confidence intervals. In addition, we develop Bayesian versions of coefficients πœ”π‘‘ and πœ”h by sampling from a second-order factor model. Results from a comprehensive simulation study show that the studied confidence intervals performed well when the sample size was sufficiently large (𝑁 β‰₯ 500). The Bayesian estimates performed well across most studied conditions. When the sample size was small and the reliability low, only the bias-corrected and accelerated bootstrap confidence interval approached a satisfactory coverage among all intervals. This study guides on πœ”π‘‘ and πœ”h confidence intervals and introduces πœ”π‘‘ and πœ”h credible intervals that are easy to use and come with the benefits of Bayesian parameter estimation.

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Available abstract

The reliability of a multidimensional test instrument is commonly estimated using coefficients πœ”π‘‘ (total) and πœ”h (hierarchical). However, point estimates for the coefficients are rarely accompanied by uncertainty estimates. In this study, we compare bootstrap and normal-theory confidence intervals. In addition, we develop Bayesian versions of coefficients πœ”π‘‘ and πœ”h by sampling from a second-order factor model. Results from a comprehensive simulation study show that the studied confidence intervals performed well when the sample size was sufficiently large (𝑁 β‰₯ 500). The Bayesian estimates performed well across most studied conditions. When the sample size was small and the reliability low, only the bias-corrected and accelerated bootstrap confidence interval approached a satisfactory coverage among all intervals. This study guides on πœ”π‘‘ and πœ”h confidence intervals and introduces πœ”π‘‘ and πœ”h credible intervals that are easy to use and come with the benefits of Bayesian parameter estimation.

Key concepts: Confidence interval, Statistics, Point estimation, Bayesian probability, Credible interval, Robust confidence intervals, Reliability (semiconductor), Mathematics

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