Classical and Bayesian Uncertainty Intervals for the Reliability of Multidimensional Scales
Julius M. Pfadt, Don van den Bergh, Morten Moshagen
Abstract
Open-access reader
Julius M. Pfadt, Don van den Bergh, Morten Moshagen
Abstract
Open-access reader
The reliability of a multidimensional test instrument is commonly estimated using coefficients ππ‘ (total) and πh (hierarchical). However, point estimates for the coefficients are rarely accompanied by uncertainty estimates. In this study, we compare bootstrap and normal-theory confidence intervals. In addition, we develop Bayesian versions of coefficients ππ‘ and πh by sampling from a second-order factor model. Results from a comprehensive simulation study show that the studied confidence intervals performed well when the sample size was sufficiently large (π β₯ 500). The Bayesian estimates performed well across most studied conditions. When the sample size was small and the reliability low, only the bias-corrected and accelerated bootstrap confidence interval approached a satisfactory coverage among all intervals. This study guides on ππ‘ and πh confidence intervals and introduces ππ‘ and πh credible intervals that are easy to use and come with the benefits of Bayesian parameter estimation.
OpenAlex reports 2 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
The reliability of a multidimensional test instrument is commonly estimated using coefficients ππ‘ (total) and πh (hierarchical). However, point estimates for the coefficients are rarely accompanied by uncertainty estimates. In this study, we compare bootstrap and normal-theory confidence intervals. In addition, we develop Bayesian versions of coefficients ππ‘ and πh by sampling from a second-order factor model. Results from a comprehensive simulation study show that the studied confidence intervals performed well when the sample size was sufficiently large (π β₯ 500). The Bayesian estimates performed well across most studied conditions. When the sample size was small and the reliability low, only the bias-corrected and accelerated bootstrap confidence interval approached a satisfactory coverage among all intervals. This study guides on ππ‘ and πh confidence intervals and introduces ππ‘ and πh credible intervals that are easy to use and come with the benefits of Bayesian parameter estimation.
Key concepts: Confidence interval, Statistics, Point estimation, Bayesian probability, Credible interval, Robust confidence intervals, Reliability (semiconductor), Mathematics