HIGH RESOLUTION INFRARED SPECTROSCOPY OF THE $\nu_{3}$ AND $\nu_{7}$ BANDS OF HEXAFLUOROETHANE
Thomas A. Blake, Steven W. Sharpe, Stephen C. Stone, Laura A. Philips
Abstract
Thomas A. Blake, Steven W. Sharpe, Stephen C. Stone, Laura A. Philips
Abstract
The $\\nu_{3}$ and $\\nu_{7}$ fundamental bands of hexafluoroethane were observed using two molecular beam techniques: pulsed slit-jet, diode laser spectroscopy, and continuous slit-jet. Fourier transform spectroscopy. The estimated rotational temperature of both beams is on the order 10 K. Preliminary analysis of the $\\nu_{3}$ parallel band shows a regular progression of strong K = 0 transitions in the $P_{1}$ $Q_{1}$ and R-branches; other sub-bands are heavily perturbed. The band origin is at 1117.1098(5) $cm^{-1}$, $B^{\\prime\\prime} = 0.06140(9)$ $cm^{-1}$ and $B^{\\prime}=0.061641$ $cm^{-1}$ for the prolate symmetric top molecule. The $\\nu_{4}$ perpendicular band is centered at $1253 cm^{-1}$ and shows a congested series of $^{R}Q$ and $^{P}Q$ sub-branches. Spectra from both spectrometers and a detailed ro-vibrational analysis will be presented for both bands
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The $\\nu_{3}$ and $\\nu_{7}$ fundamental bands of hexafluoroethane were observed using two molecular beam techniques: pulsed slit-jet, diode laser spectroscopy, and continuous slit-jet. Fourier transform spectroscopy. The estimated rotational temperature of both beams is on the order 10 K. Preliminary analysis of the $\\nu_{3}$ parallel band shows a regular progression of strong K = 0 transitions in the $P_{1}$ $Q_{1}$ and R-branches; other sub-bands are heavily perturbed. The band origin is at 1117.1098(5) $cm^{-1}$, $B^{\\prime\\prime} = 0.06140(9)$ $cm^{-1}$ and $B^{\\prime}=0.061641$ $cm^{-1}$ for the prolate symmetric top molecule. The $\\nu_{4}$ perpendicular band is centered at $1253 cm^{-1}$ and shows a congested series of $^{R}Q$ and $^{P}Q$ sub-branches. Spectra from both spectrometers and a detailed ro-vibrational analysis will be presented for both bands
Key concepts: Infrared, Spectroscopy, Infrared spectroscopy, Resolution (logic), High resolution, Physics, Remote sensing, Materials science