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Scanning near-field optical microscopy (SNOM) and its application in mineralogy

W. Gutmannsbauer, Thomas Huser, Th. Lacoste

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Abstract

Scanning near-field optical microscopy (SNOM) is a member of the family of scanning probe microscopes. It combines the high three dimensional resolution of a scanning force microscope with the contrast mechanisms of an optical microscope. An optical resolution beyond the diffraction limit can be achieved. We show the first application of this technique in the field of mineralogy, and we point out its future potential.

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What this paper is about

Scanning near-field optical microscopy (SNOM) is a member of the family of scanning probe microscopes. It combines the high three dimensional resolution of a scanning force microscope with the contrast mechanisms of an optical microscope. An optical resolution beyond the diffraction limit can be achieved. We show the first application of this technique in the field of mineralogy, and we point out its future potential.

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OpenAlex reports 5 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

Scanning near-field optical microscopy (SNOM) is a member of the family of scanning probe microscopes. It combines the high three dimensional resolution of a scanning force microscope with the contrast mechanisms of an optical microscope. An optical resolution beyond the diffraction limit can be achieved. We show the first application of this technique in the field of mineralogy, and we point out its future potential.

Key concepts: Near-field scanning optical microscope, Optical microscope, Optics, Microscopy, Microscope, Resolution (logic), Scanning ion-conductance microscopy, Scanning probe microscopy

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