1978•Japanese Journal of Applied PhysicsRequires access

Measurement of Physical Constants with An X-Ray Three-Crystal Spectrometer : REFINED SPECTROSCOPY, X-RAY OPTICS AND INSTRUMENTATION

Shoichi Annaka

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Key concepts: X-ray, Instrumentation (computer programming), X-ray spectroscopy, Spectrometer, Spectroscopy, Materials science, X-ray optics, Optics

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