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1984•Journal of Agricultural ResearchRequires access

Estimation of loss in grain yield of two wheat varieties caused by leaf rust using single tillers.

M. Nazim, Y. A. Abdou, A. A. El-Shehidi, Y. H. El-Daoudi, F. El-Rays

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Key concepts: Rust (programming language), Agronomy, Grain yield, Yield (engineering), Biology, Stripe rust, Mathematics, Plant disease resistance

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