2021•The Japan Society of Applied PhysicsRequires access

Density of States Analysis of an Amorphous In-Ga-Zn-O Thin Film studied via High-Sensitivity Ultraviolet, Hard X-ray, and Low-Energy Inverse Photoemission Spectroscopies

Ryotaro Nakazawa, Atsushi Matsuzaki, Kohei Shimizu, Emi Kawashima, Satoshi Yasuno, Adbi-Jalebi Mojtaba, Stranks D. Samuel, Yoshida Hiroyuki, Yuya Tanaka, Hiroshi Tokairin, Ishii Hisao

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Key concepts: Materials science, Ultraviolet, Amorphous solid, Sensitivity (control systems), Inverse photoemission spectroscopy, Thin film, Inverse, Energy (signal processing)