Measuring the infrared emissivity of an object with the dual temperature method
Gangbo Hu, Zhuoqiao Wu, Xue Yang, Ning Tao, Cunlin Zhang
Abstract
Gangbo Hu, Zhuoqiao Wu, Xue Yang, Ning Tao, Cunlin Zhang
Abstract
Emissivity is one of the important parameters to reflect the thermal characteristics of the surface of an object. It plays a great role in the research of infrared coatings with high or low emissivity. In this paper, a novel non-contact experimental method is proposed to measure the coating’s emissivity using the dual-temperature method, and the error of the measured infrared emissivity with different base board materials is analyzed.
A significance statement is not available in the OpenAlex record.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
Emissivity is one of the important parameters to reflect the thermal characteristics of the surface of an object. It plays a great role in the research of infrared coatings with high or low emissivity. In this paper, a novel non-contact experimental method is proposed to measure the coating’s emissivity using the dual-temperature method, and the error of the measured infrared emissivity with different base board materials is analyzed.
Key concepts: Emissivity, Infrared, Dual (grammatical number), Computer science, Object (grammar), Infrared heater, Remote sensing, Low emissivity