2021Unpublished venueRequires access

Measuring the infrared emissivity of an object with the dual temperature method

Gangbo Hu, Zhuoqiao Wu, Xue Yang, Ning Tao, Cunlin Zhang

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Abstract

Emissivity is one of the important parameters to reflect the thermal characteristics of the surface of an object. It plays a great role in the research of infrared coatings with high or low emissivity. In this paper, a novel non-contact experimental method is proposed to measure the coating’s emissivity using the dual-temperature method, and the error of the measured infrared emissivity with different base board materials is analyzed.

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What this paper is about

Emissivity is one of the important parameters to reflect the thermal characteristics of the surface of an object. It plays a great role in the research of infrared coatings with high or low emissivity. In this paper, a novel non-contact experimental method is proposed to measure the coating’s emissivity using the dual-temperature method, and the error of the measured infrared emissivity with different base board materials is analyzed.

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Available abstract

Emissivity is one of the important parameters to reflect the thermal characteristics of the surface of an object. It plays a great role in the research of infrared coatings with high or low emissivity. In this paper, a novel non-contact experimental method is proposed to measure the coating’s emissivity using the dual-temperature method, and the error of the measured infrared emissivity with different base board materials is analyzed.

Key concepts: Emissivity, Infrared, Dual (grammatical number), Computer science, Object (grammar), Infrared heater, Remote sensing, Low emissivity

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