Modified Mixed Exponentially Weighted Moving Average-Cumulative Sum Control Charts for Autocorrelated Process
Dushyant Tyagi, Vipin K. Yadav
Abstract
Dushyant Tyagi, Vipin K. Yadav
Abstract
Statistical Process Control (SPC) is an efficient methodology for monitoring, managing, analysing and recuperating process performance. Implementation of SPC in industries results in biggest benefits, as enhanced quality products and reduced process variation. While dealing with the theory of control chart we generally move with the assumption of independent process observation. But in practice usually, for most of the processes the observations are autocorrelated which degrades the ability of control chart application. The loss caused by autocorrelation can be obliterated by making modifications in the traditional control charts. The article presented here refers to a combination of EWMA and CUSUM charting techniques supplementing modifications in the control limits. The performance of the referred scheme is measured by comparing average run length (ARL) with existing control charts. Also, the referred scheme is found reasonably well for detecting particularly smaller displacements in the process.
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Statistical Process Control (SPC) is an efficient methodology for monitoring, managing, analysing and recuperating process performance. Implementation of SPC in industries results in biggest benefits, as enhanced quality products and reduced process variation. While dealing with the theory of control chart we generally move with the assumption of independent process observation. But in practice usually, for most of the processes the observations are autocorrelated which degrades the ability of control chart application. The loss caused by autocorrelation can be obliterated by making modifications in the traditional control charts. The article presented here refers to a combination of EWMA and CUSUM charting techniques supplementing modifications in the control limits. The performance of the referred scheme is measured by comparing average run length (ARL) with existing control charts. Also, the referred scheme is found reasonably well for detecting particularly smaller displacements in the process.
Key concepts: EWMA chart, CUSUM, Control chart, Autocorrelation, Statistical process control, Process (computing), Shewhart individuals control chart, Computer science