Selection of Wheat Ideotype Based on Multiple Traits using Genotype by Yield-Trait Approach

In plant breeding, a novel genotype-by-yield trait (GYT) biplot approach was introduced to select superior genotypes based on multiple traits. The present study demonstrated the application of the GYT biplot model to evaluate the superior wheat advanced lines from a panel of 24 genotypes to select the ideotype for end users. Results show that the genotype-by-trait (GT) biplot covered 57% of the total variation of the data to reveal that grain yield was strongly associated with 1000-grain weight and grain width. In contrast, the GYT biplot explained 90.2% of the total variation which was significantly much higher than GT biplot. According to tester vector view of GYT biplot almost all the yield trait combinations were associated with each other at different degree of association; whereas the genotypes present within the acute angles of tester vectors (yield trait combinations) had the trait profile contributed positively towards grain yield. The polygon biplot of GYT had eight sectors, out of which only three had the yield trait combinations. The eight genotypes were the polygon vertex among which the advanced line DF1906 of first sector was designated as the best genotype for spike length, number of spikelets per spike, grain weight per spike and number of grains per spike. Additionally, the DF1912 of second sector was early maturing coupled with high 1000-grain weight while DF1917 of third sector had short stature and gave the highest harvest index. The average tester coordination (ATC) biplot grouped 13 genotypes as superior and nine as inferior genotypes and recommended two advanced lines DF1912 and DF1917 as ideotype based on balanced traits profile. These findings strengthened the argument that the GYT biplot analysis is better than other selection indices and guaranteed the selection of superior genotypes and rejection of inferior ones based on multiple traits yield combinations. © 2021 Friends Science Publishers