2021•Solid-State ElectronicsOpen access

Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides

Umberto Celano, Y. Lee, Jill Serron, Christina H. Smith, J. Franco, Kyungho Ryu, M. Kim, S. Park, Juyul Lee, J. Kim, Paul van der Heide

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Key concepts: Kelvin probe force microscope, Volta potential, Photoconductive atomic force microscopy, Non-contact atomic force microscopy, Microscopy, Electrostatic force microscope, Dielectric, Materials science

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Harnessing charge injection in Kelvin probe force microscopy for the evaluation of oxides — Research Paper | ScholarLens