Failure Mode, Effects (and Criticality) Analysis, FME(C)A
J.P. Signoret, Alain Leroy
Abstract
J.P. Signoret, Alain Leroy
Abstract
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Key concepts: Failure mode, effects, and criticality analysis, Failure mode and effects analysis, Criticality, Reliability engineering, Reliability (semiconductor), Mode (computer interface), Computer science, System lifecycle