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2013•AGU Fall Meeting AbstractsRequires access

Why High-Resolution Characterization Matters: 3D Transport Simulations at the MADE Site

Mine Dogan, Mark M. Meerschaert, Douglas Benson, Remke L. Van Dam, J. J. Butler, D. W. Hyndman

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Key concepts: Characterization (materials science), Computer science, Materials science, Nanotechnology

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