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Quantum control, quantum information processing, and quantum-limited metrology with trapped ions

Wineland, D J, Leibfried, D, Barrett, M D, Ben-Kish, A, Bergquist, J C, Blakestad, R B, Bollinger, J J, Britton, J L, Chiaverini, J, De Marco, B L, Hume, D, Itano, W M, Jensen, M, Jost, J D, Knill, E, Koelemeij, J C J, Langer, C, Oskay, W, Ozeri, R, Reichle, R, Rosenband, T, Schätz, T, Schmidt, P O, Seidelin, S

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Abstract

We briefly discuss recent experiments on quantum information processing using trapped ions at NIST. A central theme of this work has been to increase our capabilities in terms of quantum computing protocols, but we have also applied the same concepts to improved metrology, particularly in the area of frequency standards and atomic clocks. Such work may eventually shed light on more fundamental issues, such as the quantum measurement problem.

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What this paper is about

We briefly discuss recent experiments on quantum information processing using trapped ions at NIST. A central theme of this work has been to increase our capabilities in terms of quantum computing protocols, but we have also applied the same concepts to improved metrology, particularly in the area of frequency standards and atomic clocks. Such work may eventually shed light on more fundamental issues, such as the quantum measurement problem.

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OpenAlex reports 21 citations for this work. Citation counts describe recorded attention and do not establish research quality.

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Available abstract

We briefly discuss recent experiments on quantum information processing using trapped ions at NIST. A central theme of this work has been to increase our capabilities in terms of quantum computing protocols, but we have also applied the same concepts to improved metrology, particularly in the area of frequency standards and atomic clocks. Such work may eventually shed light on more fundamental issues, such as the quantum measurement problem.

Key concepts: Quantum metrology, Quantum sensor, Quantum information processing, Quantum, Quantum information, Quantum technology, Quantum imaging, Metrology

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