2020Laser Congress 2020 (ASSL, LAC)Requires access

Silicon wafer dicing technique

Egidijus Vanagas, R. Gofman, S. Strumskis

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Abstract

Laser dicing technique – rapid (in the range 300-1000 mm/s), one pass process for semiconductor devices formed on silicon substrates. The technique allows straight and curved “clean” cleaving of silicon. © 2020 The Author(s).

About this research paper

What this paper is about

Laser dicing technique – rapid (in the range 300-1000 mm/s), one pass process for semiconductor devices formed on silicon substrates. The technique allows straight and curved “clean” cleaving of silicon. © 2020 The Author(s).

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Available abstract

Laser dicing technique – rapid (in the range 300-1000 mm/s), one pass process for semiconductor devices formed on silicon substrates. The technique allows straight and curved “clean” cleaving of silicon. © 2020 The Author(s).

Key concepts: Wafer dicing, Silicon, Wafer, Materials science, Semiconductor, Optoelectronics, Hybrid silicon laser, Semiconductor device

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