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1978•Unpublished venueRequires access

Measurement of bandgap narrowing and diffusion length in heavily doped silicon

Jef van Meerbergen, J.F.A. Nijs, Robert George Mertens, Roger Van Overstraeten

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Key concepts: Silicon, Materials science, Doping, Diffusion, Band gap, Optoelectronics, Wide-bandgap semiconductor, Length measurement

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