A Knowledge Synthesis Method for Weibull Distribution Estimation with Four Right-Censored Life Data
Liyang Xie, Jungang Ren, Jiaxin Song, Ningxiang Wu
Abstract
Liyang Xie, Jungang Ren, Jiaxin Song, Ningxiang Wu
Abstract
In the situation of product reliability estimation that all the observations available are right-censored, three-parameter Weibull distribution is applied to describe product life. A new way is presented to estimate Weibull location parameter according to four right-censored life data. Based on the property of normal distribution, the knowledge on product life distribution, and Monte Carlo simulation result, a non-parametric estimation method is applied to estimate Weibull location parameter. By an example, it is demonstrated that using three-parameter Weibull distribution is evidently better than using two-parameter Weibull distribution.
OpenAlex reports 3 citations for this work. Citation counts describe recorded attention and do not establish research quality.
A contribution statement is not available in the OpenAlex record.
Method details are not available in the OpenAlex metadata.
Findings are not separately available in the OpenAlex metadata.
Limitations are not available in the OpenAlex metadata.
Application details are not available in the OpenAlex metadata.
In the situation of product reliability estimation that all the observations available are right-censored, three-parameter Weibull distribution is applied to describe product life. A new way is presented to estimate Weibull location parameter according to four right-censored life data. Based on the property of normal distribution, the knowledge on product life distribution, and Monte Carlo simulation result, a non-parametric estimation method is applied to estimate Weibull location parameter. By an example, it is demonstrated that using three-parameter Weibull distribution is evidently better than using two-parameter Weibull distribution.
Key concepts: Weibull distribution, Exponentiated Weibull distribution, Parametric statistics, Statistics, Distribution fitting, Reliability (semiconductor), Weibull modulus, Shape parameter