2020Unpublished venueRequires access

Calibration approach for a rotating polarizer analyzer polarimeter for retardance measurements

Francisco Joel Cervantes Lozano, Geliztle A. Parra-Escamilla, H. Santiago-Hernández, Jorge Luis Flores Nuñez, Guillermo García–Torales, David I. Serrano-García

Open publisher page 1 citations

Abstract

We present a calibration approach for rotating polarizer-analyzer polarimeter dedicated to retardance measurements. The rotating polarizer-analyzer polarimeter is based on retrieving a partial Mueller matrix measurement of a transparent sample to be later associated with its phase retardation properties. Through the Mueller matrix approach, we developed a calibration procedure considering the initial orientation of the two linear polarizers used, and we present experimental results showing the feasibility of our calibration approach.

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What this paper is about

We present a calibration approach for rotating polarizer-analyzer polarimeter dedicated to retardance measurements. The rotating polarizer-analyzer polarimeter is based on retrieving a partial Mueller matrix measurement of a transparent sample to be later associated with its phase retardation properties. Through the Mueller matrix approach, we developed a calibration procedure considering the initial orientation of the two linear polarizers used, and we present experimental results showing the feasibility of our calibration approach.

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Available abstract

We present a calibration approach for rotating polarizer-analyzer polarimeter dedicated to retardance measurements. The rotating polarizer-analyzer polarimeter is based on retrieving a partial Mueller matrix measurement of a transparent sample to be later associated with its phase retardation properties. Through the Mueller matrix approach, we developed a calibration procedure considering the initial orientation of the two linear polarizers used, and we present experimental results showing the feasibility of our calibration approach.

Key concepts: Polarimeter, Polarizer, Spectrum analyzer, Calibration, Polarimetry, Mueller calculus, Optics, Materials science

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