2020International Journal of Statistics and Reliability EngineeringRequires access

Baye’s Estimation of the Parameters and Reliability Function of Two-Parameter Weibull Distribution

Vinod Kumar, Himanil Joshi, Jitendra Kumar

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Abstract

In this paper, Baye’s estimators of the shape parameter (α), scale parameter (β) and reliability function of two-parameter Weibull distribution have been obtained under different priors by using squared error loss functions (SELF). A comparison of the two methods has been made and the results are illustrated using simulation for random samples of different sizes drawn from the two-parameter Weibull distribution with known values of shape parameter (α) and scale parameter (β). A real dataset has also been used to illustrate the results.

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What this paper is about

In this paper, Baye’s estimators of the shape parameter (α), scale parameter (β) and reliability function of two-parameter Weibull distribution have been obtained under different priors by using squared error loss functions (SELF). A comparison of the two methods has been made and the results are illustrated using simulation for random samples of different sizes drawn from the two-parameter Weibull distribution with known values of shape parameter (α) and scale parameter (β). A real dataset has also been used to illustrate the results.

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Available abstract

In this paper, Baye’s estimators of the shape parameter (α), scale parameter (β) and reliability function of two-parameter Weibull distribution have been obtained under different priors by using squared error loss functions (SELF). A comparison of the two methods has been made and the results are illustrated using simulation for random samples of different sizes drawn from the two-parameter Weibull distribution with known values of shape parameter (α) and scale parameter (β). A real dataset has also been used to illustrate the results.

Key concepts: Scale parameter, Weibull distribution, Shape parameter, Estimator, Estimation theory, Mathematics, Statistics, Reliability (semiconductor)

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