Probabilistic and Non-probabilistic Synthetic Reliability Model of Structures
Jiao Shi, Dongpao Hong, Peihao He, Guangyu Jing
Abstract
Jiao Shi, Dongpao Hong, Peihao He, Guangyu Jing
Abstract
As an alternative to reliability analysis, the non-probabilistic model is an effective supplement when the interval information exists. We describe the uncertain parameters of the structures with interval variables, and establish a non-probabilistic reliability model of structures. Then, we analyze the relation between the typical interference mode and the reliability according to the structure stress-strength interference model, and propose a new measure of structure non-probabilistic reliability. Furthermore we describe other uncertain parameters with random variables when probabilistic information also exists. For the complex structures including both random variables and interval variables, we propose a probabilistic and non-probabilistic synthetic reliability model. The illustrative example shows that the presented model is feasible for structure reliability analysis and design.
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As an alternative to reliability analysis, the non-probabilistic model is an effective supplement when the interval information exists. We describe the uncertain parameters of the structures with interval variables, and establish a non-probabilistic reliability model of structures. Then, we analyze the relation between the typical interference mode and the reliability according to the structure stress-strength interference model, and propose a new measure of structure non-probabilistic reliability. Furthermore we describe other uncertain parameters with random variables when probabilistic information also exists. For the complex structures including both random variables and interval variables, we propose a probabilistic and non-probabilistic synthetic reliability model. The illustrative example shows that the presented model is feasible for structure reliability analysis and design.
Key concepts: Probabilistic logic, Reliability (semiconductor), Random variable, Computer science, Statistical model, Interval (graph theory), Reliability theory, Reliability engineering